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SignatureSPM- the Chemical AFM | Horiba
SignatureSPM is the first microscope built on a multimodal characterization platform, integrating an automated Atomic Force Microscope (AFM) with a Raman/Photoluminescence spectrometer, enabling true colocalized measurements of physical and chemical properties. Through the combined physical and chemical knowledge obtained in a single, and real-time measurement, the researcher can obtain a reliable and comprehensive analysis of the sample, with a shortened time to knowledge as a result of lesser sample handling and a data acquisition of with a high confidence level, thanks to the correlation of difference measurements.
Description
Features and Benefits:
Keep all your AFM modes and add a wide range spectrometer: Kelvin Probe Microscopy, Piezo Response Force microscopy and so on along with a unique capability to perform accurate and efficient Raman and PL measurements.
Complete separation of optical pathways of AFM and spectroscopy: Flexible laser selection for simplified adjustments and facilitated easy refocusing of high-aperture objectives.
Automatic alignment and Probe Away Technology: Achieve high repositioning tip accuracy for true colocalized measurements with no shadow from the tip and no signal interference.
Precise imaging with high resolution: Feature a large scanning range for fast response time, and low noise.
Technical Specifications:
Dimensions W x H x D (mm) : 449 mm x 310 mm (SignatureSPM) /417 mm x 422 mm (spectrometer).
Weight (kg): 17 kg.
Safety : Built-in laser safety class 1.
Warranty: 2 years as standard.
Sample scanning range : 100 μm x 100 μm x 15 μm (+/-10%).
Non-linearity: XY < 0.05%, Z < 0.05%.
Resonance frequency: XY 7 kHz (unloaded); Z 15 kHz (unloaded).
Laser wavelength: 1300 nm. No registration laser influence on photovoltaic measurements or on biological sample.
Additional information
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