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Alphacen 300 AFM | Nanosurf
The Alphacen 300 was designed to meet the needs of a large variety of samples. The tip-scanning design of the scan head ensures that imaging performance is not affected by the mass of the sample to be investigated. The mass moved during the scanning process is kept at a minimum and does not depend on the sample. The Alphacen 300 provides a number of sample chucks that can be tailored to the customer-needs. Standard sample platforms include vacuum chuck solutions for wafers, flat platforms for large and heavy samples or sample platforms that are also compatible with Nanosurf’s sample holder lineup to also allow for measurements that require special sample holders, such as sample heating or low current measurements.
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Description
Features & Benefits:
Standard AFM system.
300 mm x 300 mm sample stage.
Ideal for samples up to 45 kg.
Run automated measurement series.
Heavy glass samples.
Large samples.
Technical Specifications:
Standard imaging modes : Static force, dynamic force, phase contrast, MFM, friction force, force modulation, spreading resistance, EFM.
Imaging functions: Up to 8000×8000 data points X/Y sample slope correction.
Standard spectroscopy modes: Force–distance, amplitude–distance, phase– distance, tip current–tip voltage.
Signal analyzers: 2 signal analyzer function blocks that can be configured as dual channel lock-in.
Scan control: 28Bit X/Y/Z-DAC.
System weight: 833 kg
Stage XY resolution : < 1 µm.
Detector bandwidth: DC to 4 MHz.”
Additional information
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