Features and Benefits:
Highest accuracy and sensitivity
Modular design
Large spectral range: 190-2100 nm
Fully integrated software package for measurement, modelling and automatic operations
Obtained information:
Thin film thickness from 1Å to 50 µm
Surface and interface roughness
Optical constants (n,k) for isotropic, anisotropic and graded films
Derived optical data such as: absorption coefficient α, optical bandgap Eg
Material properties: compound alloy composition, porosity, crystallinity, morphology and more
Mueller matrix
Depolarization
Technical Specifications:
Spectral range: from 190 to 885 nm │NIR extension option up to 2100 nm
Detection: High resolution monochromator coupled to sensitive detectors
Manual Configuration:
Spot size: 0.05 – 0.1 – 1 mm (pinhole)
Sample stage: 150 mm, manual height (20mm) and tilt adjustment
Goniometer: Manually adjustable angle from 55° to 90° by step of 5°
Automatic Configuration:
Automation sample stage: 200x200mm, 300×300 mm XY sample stage, manual height (4mm) and tilt adjustment, XYZ sample stage, theta stage
Automatic goniometer: Automatically adjustable angle from 45° to 90° by step of 0.01°
Integrated Goniometer:
Manual angle of incidence: 35° to 90° by 5° step
Sample holder: 150mm, 20mm manual z height adjustment
Autocollimation system for sample alignment in option
Dimension: width: 25cm; height: 35cm; depth: 21 cm
In situ configuration:
Mechanical adaptation: CF35 or KF40 flanges
Easy swith between in-situ and ex-situ configurations