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The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
Features and Benefits:
Integrated controller, airflow shielding, vibration isolation, and XY-table (12 mm)
High resolution top view camera and side view sample observation built in
Feature-complete: All standard operating modes available
Simple cantilever exchange: no laser or detector adjustment required
No system setup needed: just plug into your PC and start the software
Technical Specifications:
Max. scan range / scan height (resolution): (1) 70 µm (1.0 nm) / 14 µm (0.2 nm)
Static / Dynamic RMS Z-noise : typ. 0.4 nm (max. 0.8 nm) / typ. 0.3 nm (max. 0.8 nm)
Max. sample size / height: 12 mm / 3.5 mm
Max. sample stage positioning range : 12 mm travel in X and Y
Approach: 4 mm linear motor, continuous or step-by-step approach
Operating system and PC requirements: Windows 7 or higher (32/64-bit), 1280×1024 px screen resolution, Core 2 CPU, 4 GB RAM, 1 free USB 2.0 port
Size (LWH) / weight / power: 204×204×160 mm / 6.5 kg / 100–240 VAC (30 W)
Power: 100–240 VAC, 50/60 Hz, 50 W
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Our team is here to help you! Call us or leave us a message and an Apel Laser consultant will be happy to answer your questions and find personalized solutions for you.
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