Features & Benefits:
50 frames/s acquisition rates – Sustainable rate at full field-of-view, out-performs CCD and interline-based ns gated ICCDs with equivalent field-of-view.
16.6 x 14.0 mm sensor matrix – Large field of view, access more of the useful active area of Ø18 mm image intensifiers without the need for optical tapers.
2.4 e- read noise – Highest dynamic range even at the fastest frame rates, up to 5 times better performance than the closest interline-based competitor
12-bit and 16-bit modes – 12-bit mode for smaller file size and absolute fastest frame rates, 16-bit for full dynamic range.
Up to 32-bit data transmission to PC – On-head intelligence to preserve dynamic range in extensive pixel binning, or high intensity pixel binning scenarios.
Optical inter-frame down to 300 ns – Ideal for PIV-type applications requiring fast dual images snapshots with high background rejection or supersonic flow analysis. The true Global Shutter mode facilitates an optical inter-frame gap down to 100 ns, although the intensifier phosphor decay time is the limiting factor. The decay time of a fast P46 phosphor is typically 200 ns (@ 10% intensity).
TE cooling down to 0oC – Efficiently minimizes dark current noise for acquisitions requiring longer sensor exposure time, e.g. integrate-on-chip mode.
High QE Gen 2 & 3 image intensifiers – Superior photon capture, with peak QE up to 50% and spectral coverage from 120 to 1,100 nm
True optical gating < 2 ns B – Billionth of a second time-resolution for accurate transient phenomena study.
Low jitter, on-board Digital Delay Generator (DDG™ ) – Highest gating timing accuracy with lowest propagation delay. Software controlled 3x triggering outputs with 10 ps setup accuracy for complex experiment integration.
Technical Specifications:
5.5 megapixel sCMOS
50 fps full frame
High dynamic range at full speed
Integrated triple output DDG
Photocathode QE up to 50%
Integrate-On-Chip gating up to 500 kHz
USB 3.0 interface
