The DriveAFM is a completely new high-end atomic force microscopy system. Its Nanosurf-typical ingenious design and the CX Controller, developed especially to maximise the potential of this scan head, yield the following specifications.
Features & Benefits:
Stand-alone tip scanning AFM scan head.
Direct drive XYZ piezo flexure scanner,
Easy accommodation of the largest variety of different samples and sample holders without restrictions to size, geometry and weight.
Open/closed loop operations for XYZ axis.
Interference-free SLD for beam deflection detection,
Photothermal drive of the cantilever for clean and stable excitation,
Compatible with small cantilevers: as small as 10 µm width,
Compatible with most inverted microscopes (Zeiss, Nikon, Olympus, Leica),
Fully motorized alignment of the photodetector and the light sources,
Maximum Petri dish height of 13 mm.
Technical Specifications:
Scan size : typ. 100 µm x 100 µm x 20 µm | min. 95 µm x 95 µm x 18 µm.
Read-out light source: 850 nm low-coherence SLD.
CleanDrive light source: 785 nm laser.
Photodetector bandwidth: ≥8 MHz.
Standard / maximum sample size: 100 mm / 150 mm.
Z-height noise dynamic: <30 pm (RMS).
DC detector noise*: <5 pm (RMS, 0.1 Hz – 1 kHz).
AC detector noise*: <25 fm/√Hz above 100 kHz.
Approach: 10 mm motorized, parallel.
*measured with a USC-F1.2-k7.3 cantilever.
