Fastmicro High Vacuum Particle Fallout Scanner
The Fastmicro High Vacuum Particle Fallout Scanner enables continuous monitoring of surface particle fallout rates, accurately detecting particle deposition from 0.5 µm (PSL equivalent) with monitoring intervals of 10 seconds or greater. This flexible system is suitable for both high vacuum conditions and ambient environments, helping engineers understand how many particles settle on critical surfaces over time.
The scanner combines high-precision optics with user-friendly software for easy visualization and data export, offering a more comprehensive view of contamination control beyond airborne particle measurements alone.
The Fastmicro High Vacuum Particle Fallout Scanner is an advanced system designed to monitor particle deposition rates in high vacuum and controlled environments. It provides accurate measurement of particle fallout starting from 0.5 µm, with measurement intervals on the order of seconds, delivering quantitative data for cleanliness control and process optimization.
Typical Applications
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high vacuum particle deposition monitoring
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critical surface cleanliness validation
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process validation in cleanroom environments
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semiconductor, optics, and microtechnology manufacturing quality control.
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