Features and Benefits:
Modular concept to exactly match your needs
Compatible with inverted microscopes
Flat and linear scanning thanks to flexure-based scanner technology
True flexibility with exchangeable cantilever holders for specialized tasks
Scanning capabilities in liquid and advanced measurement modes
Suitable for any sample size
Standard functionality:
Standard imaging modes: Static force, dynamic force, phase contrast, MFM, friction force, force modulation, spreading resistance
Imaging functions: Up to 8000×8000 data points with 24-bit zoom in 8 acquisition channels with dynamic digital filters
X/Y sample slope correction
Standard spectroscopy modes: Force–distance, amplitude–distance, phase–distance, Tip currentt–tip voltage
Standard lithography modes: Free vector objects drawing or real-time drawing by mouse
Tip lift or force control during movement from point to point
Sample approach:
Fast home, retract, and advance movement
Automatic approach with definable final end position
Continuous or step-by-step approach mode
