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The Verifire™ interferometer system provides fast and reliable measurements of surface form error, and transmitted wavefront of optical components, systems and assemblies. A true laser Fizeau design, the Verifire™ system expands upon ZYGO’s unmatched experience in surface form metrology. The ZYGO-manufactured HeNe laser source combined with ZYGO’s patented acquisition algorithms and full-featured Mx™ metrology software, enables high-precision metrology with easy to use analysis capabilities.
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Features & Benefits:
ZYGO-made HeNe laser source.
Longer lifetime than commercially available lasers, 60k hour lifetime backed by a 3-year warranty!
Higher power for improved vibration performance and low-light applications.
Wavelength stabilized to 0.0001 nm.
QPSI™ acquisition technology, available only from ZYGO, enables reliable measurements in vibration-prone environments.
Continuously-variable 1X-5X optical zoom.
Technical Specifications:
Test Beam Diameter: 4 inch (102 mm) or 6 inch (152 mm).
Alignment FOV : 4 inch: ±3 degrees, 6 inch: ±2 degrees.
Optical Centerline: 4.25 in. (108 mm).
Camera Details: Resolution: 1200 x 1200 pixels, Frame Rate: 160 Hz. Digitization: 8 bit.
Remote Control: Wired and wireless remote .
Polarization: Nominally circular (1.2:1 or better) .
Weight: 4 inch: ≤85 lb (38 kg), 6 inch: ≤100 lb (45 kg).
Power: 100 to 240 VAC, 50/60 Hz .
LASER DETAILS:
Laser Source: High power stabilized HeNe.
Class: IIIa (meets 3R ANSI requirements).
Wavelength: 633 nm.
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Electronic industry: inspection and optical characterization of screens , , , , |
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Our team is here to help you! Call us or leave us a message and an Apel Laser consultant will be happy to answer your questions and find personalized solutions for you.
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