Fastmicro Sample Scanner – Indirect Particle Counter & Measurement System
The Fastmicro Sample Scanner is designed for surface cleanliness validation and particle contamination analysis at the microscale. It operates by collecting particles from part surfaces and assemblies with compatible samplers, then rapidly analyzing those samples in the scanner — typically within seconds.
The system provides digital, traceable data including particle count, size, and position, suitable for rigorous cleanliness control workflows and compliant with standards such as ISO 14644-9. The scanner’s versatile sampler options allow measurements from flat, curved, or hard-to-reach surfaces.
The scanner is easy to use and provides an efficient workflow, making it ideal for quality control applications in production and research environments, including hard-to-reach or rough surfaces.
The Fastmicro Sample Scanner is an indirect surface particle measurement tool that uses samplers (‘tape-lift’/PMC) to detect particle contamination down to 0.5 µm with fast, quantitative, and repeatable results.
Typical Applications
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contamination control on parts and assemblies
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post-cleaning validation
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process monitoring in manufacturing and R&D
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industries with strict cleanliness requirements such as microtechnology, semiconductor production, optics, aerospace, and medical devices
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