{"id":25145,"date":"2024-03-26T14:44:26","date_gmt":"2024-03-26T12:44:26","guid":{"rendered":"https:\/\/apellaser.ro\/product\/uvisel-plus-spectroscopic-ellipsometer-horiba\/"},"modified":"2024-03-26T15:08:58","modified_gmt":"2024-03-26T13:08:58","slug":"uvisel-plus-spectroscopic-ellipsometer-horiba","status":"publish","type":"product","link":"https:\/\/apellaser.ro\/en\/product\/uvisel-plus-spectroscopic-ellipsometer-horiba\/","title":{"rendered":"UVISEL PLUS Spectroscopic Ellipsometer | Horiba"},"content":{"rendered":"

Features and Benefits:<\/strong><\/p>\n

Highest accuracy and sensitivity
\nModular design
\nLarge spectral range: 190-2100 nm
\nFully integrated software package for measurement, modelling and automatic operations<\/p>\n

Obtained information:
\nThin film thickness from 1\u00c5 to 50 \u00b5m
\nSurface and interface roughness
\nOptical constants (n,k) for isotropic, anisotropic and graded films
\nDerived optical data such as: absorption coefficient \u03b1, optical bandgap Eg
\nMaterial properties: compound alloy composition, porosity, crystallinity, morphology and more
\nMueller matrix
\nDepolarization<\/p>\n

Technical Specifications:<\/strong><\/p>\n

Spectral range: from 190 to 885 nm \u2502NIR extension option up to 2100 nm
\nDetection: High resolution monochromator coupled to sensitive detectors
\nManual Configuration:
\nSpot size: 0.05 \u2013 0.1 \u2013 1 mm (pinhole)
\nSample stage: 150 mm, manual height (20mm) and tilt adjustment
\nGoniometer: Manually adjustable angle from 55\u00b0 to 90\u00b0 by step of 5\u00b0
\nAutomatic Configuration:
\nAutomation sample stage: 200x200mm, 300×300 mm XY sample stage, manual height (4mm) and tilt adjustment, XYZ sample stage, theta stage
\nAutomatic goniometer: Automatically adjustable angle from 45\u00b0 to 90\u00b0 by step of 0.01\u00b0
\nIntegrated Goniometer:
\nManual angle of incidence: 35\u00b0 to 90\u00b0 by 5\u00b0 step
\nSample holder: 150mm, 20mm manual z height adjustment
\nAutocollimation system for sample alignment in option
\nDimension: width: 25cm; height: 35cm; depth: 21 cm
\nIn situ configuration:
\nMechanical adaptation: CF35 or KF40 flanges
\nEasy swith between in-situ and ex-situ configurations<\/p>\n","protected":false},"excerpt":{"rendered":"

Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm . The Reference Ellipsometer for Thin Film Measurements . The UVISEL Plus ellipsometer offers the best combination of modularity and performance for advanced thin film, surface and interface characterization. The new UVISEL Plus includes the newest acquisition technology designed to measure faster and more accurately than ever. FastAcq, the newest acquisition technology, is based on double modulation, designed for real world thin film characterization. Based on a new electronic, data processing and high speed monochromator, the new FastAcq technology enables a sample measurement from 190 to 2100nm to be completed within 3 minutes, at high resolution.<\/p>\n

Resources:<\/strong>
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