{"id":24624,"date":"2024-01-25T15:24:53","date_gmt":"2024-01-25T13:24:53","guid":{"rendered":"https:\/\/apellaser.ro\/product\/nexview-nx2-3d-optical-profiler-zygo\/"},"modified":"2024-01-26T09:21:52","modified_gmt":"2024-01-26T07:21:52","slug":"nexview-nx2-3d-optical-profiler-zygo","status":"publish","type":"product","link":"https:\/\/apellaser.ro\/en\/product\/nexview-nx2-3d-optical-profiler-zygo\/","title":{"rendered":"Nexview\u2122 NX2 3D Optical Profiler | Zygo"},"content":{"rendered":"

Features and Benefits:<\/strong><\/p>\n

Multiple data collection techniques provide maximum application fl exibility\u2014 for surface heights from angstroms to millimeters
\nSureScan\u2122 technology enables precision metrology in vibration-prone environments
\nSmart PSI technology enables sub-\u00c5 surface metrology in seconds
\nCorrelation to 2D and 3D standards with compliance to ISO 25178 topography results
\nStreamlined Mx\u2122 software
\nBuilt in pass\/fail, SPC, reporting, and run statistics
\nBuilt in pneumatic vibration isolation
\nOpen structure provides clear part visibility and access
\nBuilt in 75 mm head riser accommodates taller samples
\nOptional thick fi lms analysis for transparent fi lms >400 nm thick
\nOptional advanced thin fi lms software for fi lms 50-1000 nm
\nOptional 2D analysis Vision Software Suite<\/p>\n

Technical Specifications:<\/strong><\/p>\n

Surface Topography Repeatability: 0.06 nm for all magnifi cations
\nRepeatability of the RMS: 0.005 nm
\nSample Stage: XY travel: 200 mm
\nTilt: +\/- 4\u00b0
\nCapacity: 20 lbs
\nSystem Options:
\nEncoded XYZ stages
\n200×325 mm long travel XY stage
\nTheta stage
\nDimensions (H x W x D): 146 \u00d7 73 \u00d7 61 cm (57.48 \u00d7 28.74 \u00d7 24.02 in)
\nSystem Weight: 248 kg (547 lbs)<\/p>\n","protected":false},"excerpt":{"rendered":"

Designed for the most demanding applications, the Nexview\u2122 NX2 3D optical profiler combines exceptional precision, advanced algorithms, application flexibility, and automation into a single package that represents ZYGO’s most advanced Coherence Scanning Interferometric (CSI) profiler. With applications as varied as flatness, roughness and waviness, thin films, step heights and more on virtually any surface and material, Nexview NX2 truly is the no-compromise profiler.<\/p>\n