{"id":20824,"date":"2023-07-23T18:24:19","date_gmt":"2023-07-23T15:24:19","guid":{"rendered":"https:\/\/apellaser.ro\/product\/optical-spectrometer-gd-profiler-2-horiba\/"},"modified":"2023-11-21T14:36:23","modified_gmt":"2023-11-21T12:36:23","slug":"optical-spectrometer-gd-profiler-2-horiba","status":"publish","type":"product","link":"https:\/\/apellaser.ro\/en\/product\/optical-spectrometer-gd-profiler-2-horiba\/","title":{"rendered":"Optical spectrometer – GD-Profiler 2\u2122 | Horiba"},"content":{"rendered":"

Features & Benefits:<\/strong><\/p>\n

RF-Only generator is Class E standard and optimized for stability and crater shape allowing for real surface analysis.
\nSource can be pulsed with synchronized acquisition for optimum results on fragile samples. The use of an RF source allows analysis of conventional and non conventional layers and materials.
\nSimultaneous optic provides full spectral coverage from 110 to 800nm, including deep UV access to analyze H, O, C, N and Cl.
\nHORIBA original, ion-etched holographic gratings assure the highest light throughput and resolution for maximum light efficiency and sensitivity.
\nPatented HDD detection provides speed and sensitivity in detection without compromise.
\nOn line measurement of crater depth and erosion rate with patented built in Interferometer. DIP.
\nEasily accessible sample compartment allows plenty of room for sample loading.
\nPowerful QUANTUM\u2122 software with Tabler report writing tool.
\nCenterLite laser pointer (patent pending) for precise sample loading.
\nMonochromator option available only from HORIBA provides the perfect tool to increase instrument flexibility while adding “n+1” capability.<\/p>\n

Technical Specifications:<\/strong><\/p>\n

Typical domains of applications include PV, metallurgy, LED manufacturing, corrosion studies, organic and micro-electronics, materials research & development, deposition processes optimisation, PVD, CVD, plasma coatings, automotive, Li batteries, etc
\nNo UHV required.
\nMeasurement of all elements of interest (including H, D, O, Li, Na, C, N etc) with patented High Dynamic Detectors.
\nOptional monochromator with Image mode and high Dynamic detection for full spectrum record and total flexibility.
\nPulsed RF Source for operation in RF and pulsed RF modes with auto-matching
\nDifferential double pumping of the source for patented SEM sample preparation
\nPlasma Cleaning function built in
\nPatented UFS for Ultra-Fast Sputtering of polymeric and organic materials
\nPatented DIP \u2013 built in interferometer for direct on line depth measurement
\nVarious anode diameters and accessories for odd shape samples
\nWindows 10 software \u2013 Multiple copies provided for remote installations<\/p>\n","protected":false},"excerpt":{"rendered":"

The GD-Profiler 2\u2122 provides fast, simultaneous analysis of all elements of interest including the gases nitrogen, oxygen, hydrogen and chlorine. It is an ideal tool for thin and thick films characterization and process studies. Equipped with an RF source that can operate in pulsed mode for fragile samples, the range of applications of the GD-Profiler 2\u2122 goes from corrosion studies to PVD coating process control, from thin film PV development to LED Quality Control and it is used in Universities as well as in Industrial Research laboratories.<\/span><\/p>\n

Resources:\u00a0<\/strong><\/p>\n