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</html><thumbnail_url>https://apellaser.ro/wp-content/uploads/2023/07/Alphacen-300-mm-AFM-for-heavy-and-large-samples-1.webp</thumbnail_url><thumbnail_width>1123</thumbnail_width><thumbnail_height>749</thumbnail_height><description>The Alphacen 300 was designed to meet the needs of a large variety of samples. The tip-scanning design of the scan head ensures that imaging performance is not affected by the mass of the sample to be investigated. The mass moved during the scanning process is kept at a minimum and does not depend on the sample. The Alphacen 300 provides a number of sample chucks that can be tailored to the customer-needs. Standard sample platforms include vacuum chuck solutions for wafers, flat platforms for large and heavy samples or sample platforms that are also compatible with Nanosurf&#x2019;s sample holder lineup to also allow for measurements that require special sample holders, such as sample heating or low current measurements.  Resources:  BrochureManufacturer</description></oembed>
